A PRACTICAL APPROACH TO ELECTRONIC COMPONENT DETECTION ON PCBs USING YOLOv11 DEEP LEARNING MODEL

Các tác giả

  • Xuan-Huy Nguyen Nha Trang University, Vietnam Tác giả
  • Khai Hoan Nhu Nha Trang University, Vietnam Tác giả
  • Xuan-Giang Nguyen Nha Trang University, Vietnam Tác giả
  • Thanh-Tuan Nguyen Nha Trang University, Vietnam Tác giả liên hệ

DOI:

https://doi.org/10.62985/j.huit_ojs.vol26.no2E.415

Từ khóa:

YOLOv11, Automated Optical Inspection (AOI), Electronic Component Detection, Printed Circuit Board (PCB)

Tóm tắt

In the field of PCB manufacturing, Automated Optical Inspection (AOI) is critical for defect detection. However, traditional methods often fail under varying lighting and complex background conditions. To overcome these issues, this paper presents a deep learning-based approach using the YOLOv11 model for robust electronic component detection. We establish a complete workflow for identifying components such as resistors, capacitors, and ICs, validated through a custom dataset. A key contribution of this work is the comprehensive evaluation of the YOLOv11 architecture specifically optimized for PCB component identification. Validated through a custom dataset, the YOLOv11 model achieved a robust accuracy with an mAP@0.5 of 97.5% on standard hardware. This study demonstrates the feasibility of utilizing YOLOv11 for high-precision Automated Quality Control (QC) in PCB manufacturing. This study demonstrates the feasibility of YOLOv11 in industrial environments and provides a framework for future optimization studies.

Tài liệu tham khảo

[1] S. Schneidereit, A. M. Yarahmadi, T. Schneidereit, M. Breuß, and M. Gebauer, "YOLO-based object detection in Industry 4.0 Fischertechnik model environment," in Intelligent Systems and Applications – IntelliSys 2023, Lecture Notes in Networks and Systems, vol. 823, Springer, Cham, 2024, pp. 1–20, doi: https://doi.org/10.1007/978-3-031-47724-9_1

[2] N. Rane, "YOLO and Faster R-CNN object detection for smart Industry 4.0 and Industry 5.0: applications, challenges, and opportunities," SSRN Electron. J., Oct. 2023, doi: https://doi.org/10.2139/ssrn.4624206

[3] T.-S. Jian, M. H. F. Md Fauadi, S. H. Yahaya, and A. Z. Mohamed Noor, "A deep learning approach for automated PCB defect detection: A comprehensive review," Multidiscip. Rev., vol. 8, no. 1, p. 2025011, 2024, doi: https://doi.org/10.31893/multirev.2025011

[4] J. Meng, L. Guo, W. Hao, and D. K. Jain, "A surface defect detection method for electronic products based on improved YOLOv11," PLoS ONE, vol. 20, no. 10, p. e0334333, Oct. 2025, doi: https://doi.org/10.1371/journal.pone.0334333

[5] J. Wang, H. Dai, T. Chen, H. Liu, X. Zhang, Q. Zhong, and R. Lu, "Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector," Sci. Rep., vol. 13, p. 7062, May 2023, doi: https://doi.org/10.1038/s41598-023-33804-w

[6] X. Kong, G. Liu, and Y. Gao, "GESC-YOLO: Improved lightweight printed circuit board defect detection based algorithm," Sensors, vol. 25, no. 10, p. 3052, May 2025, doi: https://doi.org/10.3390/s25103052

[7] B. Liu, D. Chen, and X. Qi, "YOLO-pdd: A novel multi-scale PCB defect detection method using deep representations with sequential images," arXiv preprint arXiv:2407.15427, Jul. 2024, doi: https://doi.org/10.48550/arXiv.2407.15427

[8] Z. F. Elsharkawy, "Enhanced YOLOv11 framework for high-precision defect detection in printed circuit boards," Sci. Rep., vol. 15, p. 42550, Nov. 2025, doi: https://doi.org/10.1038/s41598-025-27415-w

[9] S. Lv, B. Ouyang, Z. Deng, T. Liang, S. Jiang, K. Zhang, J. Chen, and Z. Li, "A dataset for deep learning-based detection of printed circuit board surface defects," Sci. Data, vol. 11, p. 811, Jul. 2024, doi: https://doi.org/10.1038/s41597-024-03656-8

[10] S. Luo, F. Wan, G. Lei, L. Xu, Z. Ye, W. Liu, W. Zhou, and C. Xu, "EC-YOLO: Improved YOLOv7 model for PCB electronic component detection," Sensors, vol. 24, no. 13, p. 4363, Jul. 2024, doi: https://doi.org/10.3390/s24134363

[11] G. Spadaro, G. Vetrano, B. Penna, A. Serena, and A. Fiandrotti, "Towards one-shot PCB component detection with YOLO," in Image Analysis and Processing – ICIAP 2023 Workshops, Lecture Notes in Computer Science, vol. 14365, Springer, Cham, 2024, pp. 51–61, doi: https://doi.org/10.1007/978-3-031-51023-6_5

[12] S. Nasri, N. Ahmad, Q. U. A. Aini, A. Qayyum, and N. U. Islam, "A YOLOv9: Deep learning-based framework defect detection method for PCBs," J. Electron. Test., vol. 41, pp. 545–559, 2025, doi: https://doi.org/10.1007/s10836-025-06194-2

Lượt tải xuống

Đã Xuất bản

2026-06-11

Số

Chuyên mục

Điện - Điện tử - Tự động hóa